On-Die Power Rail Measurements: Setup and Best Practices
Accurate on-die power rail measurements depend on proper sense-line design, differential probing, and careful test setup at the package level.
This guide explains how to measure and validate power rail sequencing in embedded systems to ensure proper startup timing and long-term reliability.
This guide explains how to capture and correlate low- and high-speed events in embedded systems by balancing sample rate, memory depth, and measurement techniques.
Use serial decoding and digital-to-analog conversion techniques to track inaccessible sensor data and correlate it with system behavior in embedded designs.
This article explains how PDN design, probing method, and measurement location influence power rail noise—and why board-level measurements can be misleading.
This tutorial explains how quiet I/O probing reveals true on-die rail compression—often far greater than what traditional board-level measurements show.
Discover how to accurately measure PLCA timing in 10Base-T1S networks using oscilloscope decoding, cursors, and automated serial bus measurements.
Understand how ripple patterns and resonance effects in S-parameters expose impedance mismatches, interconnect length, and signal integrity behavior.
Understand how return loss and insertion loss interact—and why keeping S11 below −13 dB helps preserve signal integrity in real-world interconnects.
S-parameters reveal how signals reflect and transmit through interconnects, offering powerful insight into impedance, loss, and overall signal integrity.
Oscilloscope tools like measurement parameter tracking and histograms reveal how PWM pulse width, duty cycle, and modulation behavior change over time.
Accurate ESD pulse measurement depends on using a high enough sampling rate to capture sufficient points on the rising edge for reliable characterization.
Standard IEEE pulse definitions can misinterpret fast-decaying ESD pulses, requiring manual threshold adjustments for accurate measurements.