Transmission line losses—driven by skin effect and dielectric properties—play a critical role in degrading high-speed signal integrity and eye performance.
Transmission line loss directly affects eye diagram quality, with around −12 dB at Nyquist marking the limit before signal integrity rapidly degrades without equalization.
William manages oscilloscope and probe product lines, high-speed DAQs, and power applications. He holds an M.S.E.E. from SUNY at Stony Brook and enjoys playing football (i.e., soccer for those in the U.S.), tennis, and cricket in his spare time.
This guide explains how to capture and correlate low- and high-speed events in embedded systems by balancing sample rate, memory depth, and measurement techniques.
Use serial decoding and digital-to-analog conversion techniques to track inaccessible sensor data and correlate it with system behavior in embedded designs.
