Transmission line losses—driven by skin effect and dielectric properties—play a critical role in degrading high-speed signal integrity and eye performance.
Transmission line loss directly affects eye diagram quality, with around −12 dB at Nyquist marking the limit before signal integrity rapidly degrades without equalization.
Guidance on selecting, configuring, and using probes for accurate high-fidelity measurements. Covers probe loading, bandwidth considerations, grounding techniques, and common measurement mistakes.
Attaching multiple probes to the same test point can cause probe loading and interference, leading to inaccurate oscilloscope measurements and distorted waveforms.
While built-in isolated inputs offer convenience and safety, high-quality isolated probes deliver superior noise immunity and performance in fast-switching, high-voltage environments.
These nine practical DDR probing tips help reduce strain, improve signal integrity, and avoid common measurement pitfalls when working with high-speed DRAM interfaces.
A simple in-circuit test reveals how a differential probe’s CMRR behaves across frequencies and how closely it matches published specifications in real measurement environments.
What if we remove the probes from the equation by connecting our DUT's output directly to the oscilloscope's analog input using a 3-ft. 50-Ω coaxial cable?
