Transmission line losses—driven by skin effect and dielectric properties—play a critical role in degrading high-speed signal integrity and eye performance.
Transmission line loss directly affects eye diagram quality, with around −12 dB at Nyquist marking the limit before signal integrity rapidly degrades without equalization.
Embedded systems contain analog, digital, serial data, power and other signals. Learn tips and techniques for fast and efficient embedded system testing and validation.
This guide explains how to capture and correlate low- and high-speed events in embedded systems by balancing sample rate, memory depth, and measurement techniques.
Use serial decoding and digital-to-analog conversion techniques to track inaccessible sensor data and correlate it with system behavior in embedded designs.
